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Current State of the Mixed-Signal Test Bus 1149.4.

Jari HannuJuha HäkkinenJuha-Veikko VoutilainenHeli JantunenMarkku Moilanen
Published in: J. Electron. Test. (2012)
Keyphrases
  • vlsi circuits
  • state space
  • image analysis
  • high speed
  • multimedia
  • pattern recognition