Special Issue on Testability and Dependability of Artificial Intelligence Hardware.
Partha Pratim PandePublished in: IEEE Des. Test (2023)
Keyphrases
- special issue
- artificial intelligence
- applied intelligence
- ambient intelligence
- ai edam
- ecml pkdd
- low cost
- international journal
- intelligent systems
- special section
- hardware and software
- complex systems
- real time
- massively parallel
- hardware implementation
- machine learning
- embedded systems
- computational intelligence
- natural language processing
- knowledge representation
- software systems
- information processing
- decision support system
- software engineering
- expert systems