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Defect-related degradation of Deep-UV-LEDs.
Matteo Meneghini
Diego Barbisan
Y. Bilenko
Maxim S. Shatalov
J. Yang
R. Gaska
Gaudenzio Meneghesso
Enrico Zanoni
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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data sets
machine learning
real time
neural network
three dimensional
database systems
wide range
multiresolution
unsupervised learning