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Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS.
Roel Maes
Vladimir Rozic
Ingrid Verbauwhede
Patrick Koeberl
Erik van der Sluis
Vincent van der Leest
Published in:
ESSCIRC (2012)
Keyphrases
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experimental evaluation
cmos technology
power consumption
high speed
low power
low cost
nm technology
silicon on insulator
machine learning
video sequences
expert systems
synthetic and real datasets
circuit design