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Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits.
O. Mrooz
A. Kovalski
J. Pogorzelska
O. I. Shpotyuk
M. Vakiv
Bohdan S. Butkiewicz
J. Maciak
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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electronic circuits
parallel processing
data sets
database
databases
information technology