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Abnormal Event Analysis Using Patching Matching and Concentric Features.

Jun-Wei HsiehSin-Yu ChenChao-Hong Chiang
Published in: KES (2) (2009)
Keyphrases
  • feature set
  • keypoints
  • feature vectors
  • data sets
  • image features
  • statistical analysis
  • learning algorithm
  • multiscale
  • object recognition
  • benchmark datasets
  • matching process