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Robust single-shot fringe pattern projection for three-dimensional measurements.

B. BudiantoDaniel Pak-Kong LunWeiping Zhu
Published in: DSP (2017)
Keyphrases
  • three dimensional
  • single shot
  • structured light
  • x ray
  • image sequences
  • high resolution
  • d objects
  • vision system
  • multi view
  • infrared
  • noisy measurements