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FFT test of A/D converters to determine the integral nonlinearity.
Francesco Adamo
Filippo Attivissimo
Nicola Giaquinto
Mario Savino
Published in:
IEEE Trans. Instrum. Meas. (2002)
Keyphrases
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data mining
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fourier transform
databases
information retrieval
e learning
knowledge base
image processing
face recognition
data structure
frequency domain
mellin transform