Digital twin-based research on the prediction method for the complex product assembly abnormal events.
Yunrui WangYan LiWenzhe RenPublished in: Int. J. Comput. Integr. Manuf. (2021)
Keyphrases
- prediction model
- high accuracy
- pairwise
- significant improvement
- cost function
- experimental evaluation
- prediction algorithm
- high precision
- computational cost
- prediction error
- model selection
- segmentation method
- synthetic data
- abnormal events
- real world
- detection method
- support vector machine svm
- image registration
- support vector machine
- image data
- probabilistic model
- learning algorithm