Statistical characterization and optimization of integrated circuits based on singular value decomposition.
M. A. StyblinskiJoos VandewalleM. SenguptaPublished in: ICECS (1996)
Keyphrases
- singular value decomposition
- integrated circuit
- singular values
- least squares
- low rank
- dimension reduction
- latent semantic indexing
- dimensionality reduction
- reconstruction error
- null space
- low rank matrix
- latent semantic analysis
- neural network
- principal component analysis
- data matrix
- signal processing
- correlation matrix
- data sets
- hardware description language