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2D discrete high order energy operators for surface profiling using white light interferometry.
Fabien Salzenstein
Paul C. Montgomery
Abderrazzaq Benatmane
Abdel-Ouahab Boudraa
Published in:
ISSPA (1) (2003)
Keyphrases
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high order
white light interferometry
thin film
higher order
pairwise
low order
three dimensional
energy consumption
energy minimization
tensor analysis
bayesian logistic regression
surface reconstruction
face recognition
fourth order
lower order
partial differential equations
d objects
image processing