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The potential of IoT for instrumentation and measurement.

Boon-Yaik OoiShervin Shirmohammadi
Published in: IEEE Instrum. Meas. Mag. (2020)
Keyphrases
  • management system
  • database
  • computer vision
  • real world
  • three dimensional
  • high level
  • cloud computing
  • data acquisition
  • big data