Efficient fracturing of all angle shaped VLSI mask pattern data.
Georg PelzVolker Meyer zu BextenPublished in: Integr. (1991)
Keyphrases
- data sets
- database
- high quality
- data sources
- data processing
- raw data
- statistical analysis
- data collection
- data analysis
- prior knowledge
- data structure
- synthetic data
- complex data
- knowledge discovery
- image data
- small number
- computer systems
- pattern matching
- data quality
- training data
- high dimensional data
- data distribution
- missing values
- decision trees