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RTS noise reduction of 1Y-nm floating gate NAND flash memory using process optimization.

Sungho KimMyeongwon LeeGil-Bok ChoiJaekwan LeeYunbong LeeMyoungkwan ChoKunok AhnJinwoong Kim
Published in: IRPS (2015)
Keyphrases
  • noise reduction
  • flash memory
  • solid state
  • signal to noise ratio
  • main memory
  • global optimization
  • embedded systems
  • random access
  • noisy environments
  • data structure
  • data storage
  • noise free