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Estimating returns to scale using non-parametric deterministic technologies: A new method based on goodness-of-fit.

Kristiaan KerstensPhilippe Vanden Eeckaut
Published in: Eur. J. Oper. Res. (1999)
Keyphrases
  • goodness of fit
  • cost function
  • pairwise
  • probabilistic model
  • classification accuracy
  • mutual information
  • maximum likelihood
  • em algorithm
  • chi square