Sampling circuits that break the kT/C thermal noise limit.
Ron KapustaHaiyang ZhuColin LydenPublished in: CICC (2013)
Keyphrases
- noise reduction
- infrared
- random noise
- noisy data
- random sampling
- signal to noise ratio
- row column
- low pass filtering
- monte carlo
- parameter space
- additive noise
- noise free
- sampled data
- low cost
- power consumption
- arbitrary shape
- image noise
- sample size
- circuit design
- sampling strategy
- low signal to noise ratio
- missing data
- analog vlsi