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A self-learning framework to detect the intruded integrated circuits.

Faiq Khalid LodhiImran Hafeez AbbasiFaiq KhalidOsman HasanFalah R. AwwadSyed Rafay Hasan
Published in: ISCAS (2016)
Keyphrases
  • integrated circuit
  • signal processing
  • main contribution
  • x ray
  • database
  • computer vision
  • decision trees
  • multiscale
  • low cost
  • lightweight
  • detection algorithm