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Highly Reliable Reference Bitline Bias Designs for 64 Mb and 128 Mb Chain FeRAMs.

Ryu OgiwaraDaisaburo TakashimaSumiko M. DoumaeShinichiro ShiratakeRyosuke TakizawaHidehiro Shiga
Published in: IEEE J. Solid State Circuits (2015)
Keyphrases
  • highly reliable
  • times faster
  • inter frame
  • data mining
  • hard disk
  • real time
  • neural network
  • data structure
  • multiresolution
  • motion estimation