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Strain-induced enhancement of free-carrier effects in SiGe for optical modulator and VOA applications.

Younghyun KimMitsuru TakenakaTakenori OsadaMasahiko HataShinichi Takagi
Published in: OFC (2014)
Keyphrases
  • image enhancement
  • image processing
  • database
  • multiscale
  • thin film
  • finite element analysis
  • solid state
  • sigma delta