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Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in.
Zohar Shay Karnin
Partha Mukhopadhyay
Amir Shpilka
Ilya Volkovich
Published in:
STOC (2010)
Keyphrases
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higher order
depth map
high speed
black box
learning algorithm
circuit design
principal component analysis
case study
feature space
high quality
software testing
neural network
analog circuits
logic circuits
delay insensitive
analog vlsi
vlsi circuits