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Sub-sircuit model of fully-depleted double-gate FinFET including the effects of oxide and interface trapped charge.

Tatjana Pesic-BrdjaninNebojsa D. Jankovic
Published in: EUROCON (2015)
Keyphrases
  • computational model
  • data sets
  • probabilistic model
  • high level
  • mathematical model
  • experimental data
  • database
  • machine learning
  • management system
  • theoretical framework
  • autoregressive
  • mathematical analysis