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Phase transition in sputtered HfO2 thin films: A qualitative raman study.

Gustavo S. BeloFabio NakagomiAuxence MinkoSebastião William da SilvaPaulo César de MoraisDouglas A. Buchanan
Published in: CCECE (2012)
Keyphrases
  • phase transition
  • thin film
  • np complete
  • satisfiability problem
  • cost effective
  • neural network
  • lower bound
  • cellular automata