Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects.
Fayçal DjeffalToufik BentrciaMohamed Amir AbdiT. BendibPublished in: Microelectron. Reliab. (2011)
Keyphrases
- computational model
- high level
- mathematical model
- network model
- formal model
- cost function
- theoretical framework
- theoretical analysis
- simulation model
- bayesian framework
- conceptual model
- statistical model
- data mining
- em algorithm
- least squares
- management system
- probability distribution
- prior knowledge
- social networks