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Upgrade of goniospectrophtometer GEFE for near-field scattering and fluorescence radiance measurements.

Berta BernadAlejandro FerreroAlicia PonsM. Luisa HernanzJoaquín Campos Acosta
Published in: Measuring, Modeling, and Reproducing Material Appearance (2015)
Keyphrases
  • optical properties
  • image analysis
  • subsurface scattering
  • long range
  • life cycle
  • measurement noise
  • neural network
  • light field
  • image processing
  • high dynamic range
  • fluorescence microscopy