Rigorous mathematical model of through-silicon via capacitance.
Kibeom KimJedok KimHongkyun KimSeungyoung AhnPublished in: IET Circuits Devices Syst. (2018)
Keyphrases
- probabilistic model
- prior knowledge
- experimental data
- analytical model
- objective function
- management system
- neural network model
- theoretical analysis
- low cost
- rigorous mathematical
- formal model
- simulation model
- statistical model
- computational model
- real time
- least squares
- cost function
- information systems
- neural network