A reconfigurable test method based on LFSR for 3D stacking integrated circuits.
Chen TianJianyong LuLiu JunHuaguo LiangYingchun LuMaoxiang YiPublished in: Integr. (2022)
Keyphrases
- integrated circuit
- synthetic data
- detection method
- computational cost
- high accuracy
- significant improvement
- preprocessing
- objective function
- cost function
- data sets
- low cost
- detection algorithm
- segmentation method
- image analysis
- dynamic programming
- computational complexity
- image sequences
- classification method
- high precision
- learning algorithm