Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems.
Nikolaos PapandreouThomas P. ParnellHaralampos PozidisThomas MittelholzerEvangelos EleftheriouCharles CampThomas GriffinGary A. TresslerAndrew WallsPublished in: ACM Great Lakes Symposium on VLSI (2014)
Keyphrases
- flash memory
- read write
- solid state
- disk drives
- embedded systems
- garbage collection
- random access
- storage systems
- file system
- buffer management
- data storage
- hard disk
- storage devices
- data management
- management system
- main memory
- power system
- database systems
- b tree
- memory management
- distributed systems
- multi dimensional
- open source