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Composite Wafer Defect Recognition Framework Based on Multiview Dynamic Feature Enhancement With Class-Specific Classifier.

Wenjun LuoHuan Wang
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
  • class specific
  • multiple features
  • object recognition
  • feature vectors
  • feature set
  • multi view
  • data sets
  • feature selection
  • decision trees
  • viewpoint
  • small number
  • co occurrence
  • object class
  • multiple instance learning