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Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk.

Rainer NiedermayrTobias RöhmStefan Wagner
Published in: PeerJ Comput. Sci. (2019)
Keyphrases
  • computational cost
  • decision making
  • significant improvement
  • qualitative and quantitative
  • data sets
  • information systems
  • face recognition
  • relational databases
  • statistical methods
  • statistical significance