A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 μ V/°C Offset Drift.
Muhammed BolatkaleMichiel A. P. PertijsWilko J. KindtJohan H. HuijsingKofi A. A. MakinwaPublished in: IEEE J. Solid State Circuits (2011)