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Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis.
Gabriel Zaid
Lilian Bossuet
François Dassance
Amaury Habrard
Alexandre Venelli
Published in:
IACR Trans. Cryptogr. Hardw. Embed. Syst. (2021)
Keyphrases
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success rate
deep learning
unsupervised learning
machine learning
unsupervised feature learning
deep architectures
mental models
restricted boltzmann machine
data sets
weakly supervised
computer vision
pattern recognition
object recognition