Analysis of Materials Emissivity Based on Image Software.
Rui PitarmaJoão CrisóstomoLuís JorgePublished in: WorldCIST (1) (2016)
Keyphrases
- image analysis
- image data
- input image
- low level
- image retrieval
- image features
- single image
- image representation
- image collections
- image content
- camera calibration
- high resolution
- image classification
- analysis tool
- image pixels
- image regions
- similarity measure
- image segmentation
- static analysis
- multiscale
- test images
- template matching
- pixel values
- image noise
- computer systems
- image matching
- level set
- video sequences
- image sequences