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Measuring Volterra Kernels of Analog-to-Digital Converters Using a Stepped Three-Tone Scan.
Niclas Björsell
Petr Suchánek
Peter Händel
Daniel Rönnow
Published in:
IEEE Trans. Instrum. Meas. (2008)
Keyphrases
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circuit design
data conversion
support vector
delta sigma
mixed signal
least squares
printed circuit
image enhancement
digital media
higher order statistics
sigma delta
kernel function
digital content
multiple kernel
vlsi architecture
low power
kernel methods
noise shaping