Atomistic study of SiN based ReRAM with high program/erase cycle endurance.

Keita Yamaguchi Hiroki Shirakawa Kenji Shiraishi

Published in: IEICE Electron. Express (2018)

Keyphrases

machine learning
databases
image processing
multi agent systems
artificial neural networks
database
neural network
information retrieval
artificial intelligence
e learning
wide range
study proposes