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Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function.

Yun Q. ShiGuorong XuanChengyun YangJianjiong GaoZhenping ZhangPeiqi ChaiDekun ZouChunhua ChenWen Chen
Published in: ITCC (1) (2005)
Keyphrases
  • statistical moments
  • multiscale
  • wavelet transform
  • denoising
  • image segmentation
  • high quality
  • multiresolution
  • principal component analysis
  • high frequency