Statistical modeling and classification of reflectance confocal microscopy images.
Abdelghafour HalimiHadj BatatiaJimmy le DigabelGwendal JosseJean-Yves TourneretPublished in: CAMSAP (2017)
Keyphrases
- statistical modeling
- statistical models
- predictive modeling
- pattern recognition
- feature selection
- classification accuracy
- decision trees
- automatic classification
- confocal microscopy images
- classification method
- supervised learning
- support vector machine svm
- image data
- feature vectors
- feature extraction
- computer vision
- image classification
- multi view
- single image
- machine learning algorithms
- feature space
- specular reflection
- image sequences