CNN and ensemble learning based wafer map failure pattern recognition based on local property based features.
Minghao PiaoCheng Hao JinPublished in: J. Intell. Manuf. (2023)
Keyphrases
- ensemble learning
- pattern recognition
- weak learners
- feature extraction
- ensemble classifier
- generalization ability
- concept drift
- random forest
- classification accuracy
- expert systems
- image classification
- artificial neural networks
- feature space
- image processing
- feature selection
- image features
- mutual subspace method
- ensemble methods
- feature set
- data sets
- face recognition
- neural network