Deep Classifiers with Label Noise Modeling and Distance Awareness.
Vincent FortuinMark CollierFlorian WenzelJames Urquhart AllinghamJeremiah Zhe LiuDustin TranBalaji LakshminarayananJesse BerentRodolphe JenattonEffrosyni KokiopoulouPublished in: Trans. Mach. Learn. Res. (2022)