Efficient Integrated Circuits Characterization Through Computer Vision Assistance.
Raphael AbeleJean-Luc DamoiseauxDaniele FrontePierre-Yvan LiardetJean-Marc BoïDjamal MeradPublished in: ETFA (2020)
Keyphrases
- integrated circuit
- computer vision
- pattern recognition
- object recognition
- data sets
- computationally expensive
- cost effective
- object detection
- machine learning
- image features
- motion estimation
- image analysis
- signal processing
- image segmentation
- structure from motion
- information systems
- image understanding
- genetic algorithm