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Piecewise linear second moment statistical simulation of ICs affected by non-linear statistical effects.

Giorgio BiagettiPaolo CrippaAlessandro CurziSimone OrcioniClaudio Turchetti
Published in: Int. J. Circuit Theory Appl. (2010)
Keyphrases
  • piecewise linear
  • statistical analysis
  • data sets
  • knn
  • semi supervised
  • model selection