Machine Learning-based model for Single Event Upset Current Prediction in 14nm FinFETs.
VibhuSparsh MittalVivek KumarPublished in: VLSID (2023)
Keyphrases
- machine learning
- probabilistic model
- mathematical model
- computational model
- prediction model
- pattern recognition
- text classification
- experimental data
- statistical model
- cost function
- computer vision
- neural network
- access control
- model selection
- prediction accuracy
- hidden markov models
- bayesian networks
- simulation model
- data mining