Pattern overlap implies runaway growth in hierarchical tile systems.

David Doty Ho-Lin Chen Ján Manuch Arash Rafiey Ladislav Stacho

Published in: J. Comput. Geom. (2016)

Keyphrases

computing systems
databases
intelligent systems
learning systems
pattern matching
coarse to fine
database
data mining
computer vision
image processing
case study
expert systems
computer systems