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Analysis of Si and GaN GAA-NW-FETs in High-k Gate Oxides for Next Generation Mobile Systems.

Ygor FonsecaRafael NóbregaUlysses DuarteThiago R. RaddoIyad DayoubAnderson L. SanchesMurilo Bellezoni Loiola
Published in: CSNDSP (2020)
Keyphrases
  • real time
  • management system
  • mathematical analysis
  • mobile devices
  • statistical analysis
  • neural network
  • data analysis
  • expert systems
  • image analysis
  • wireless networks
  • computing environments
  • wireless systems