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An Effective Test Algorithm and Diagnostic Implementation for Embedded Static Random Access Memories.

Ze-Wang ChenJian-Hua SuYou-Ren Wang
Published in: J. Circuits Syst. Comput. (2011)
Keyphrases
  • random access
  • learning algorithm
  • optimal solution
  • database systems
  • data structure
  • selection algorithm
  • parallel implementation
  • parallel architecture