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Radiation-Hardened Designs for Soft-Error-Rate Reduction by Delay-Adjustable D-Flip-Flops.
Yuwen Dave Lin
Charles H.-P. Wen
Herming Chiueh
Published in:
ACM Great Lakes Symposium on VLSI (2017)
Keyphrases
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error rate
flip flops
power dissipation
power consumption
test set
low power
multiple input
lower error rates
x ray
equal error rate
misclassification rate
digital signal processing
word error rate
pattern recognition
cost sensitive classification
master slave
neural network
video sequences
image processing