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Post Assembly Timing Closure for Multi Million Gate Chips.

Shashank PrasadDongzi LiuOleg LevitskyDave NoiceShailendra Srivastava
Published in: VLSI Design (2010)
Keyphrases
  • high speed
  • high quality
  • real world
  • database
  • data mining
  • multiscale
  • objective function
  • integrated circuit
  • tens of thousands
  • assembly systems