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DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability.

Seong-Lyong GongJungrae KimSangkug LymMichael B. SullivanHoward DavidMattan Erez
Published in: HPCA (2018)
Keyphrases
  • high reliability
  • low cost
  • high precision
  • low overhead
  • real time
  • higher level
  • remote control
  • neural network
  • evolutionary algorithm
  • high speed
  • signal processing
  • ranked list
  • vlsi implementation