Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing.
Michael I. BaronChoudur K. LakshminarayanZhenwu ChenPublished in: Technometrics (2001)
Keyphrases
- markov random field
- semiconductor manufacturing
- pattern recognition
- discrete event simulation
- process control
- random fields
- belief propagation
- image segmentation
- graph cuts
- mrf model
- higher order
- parameter estimation
- pairwise
- energy function
- maximum a posteriori
- energy minimization
- image restoration
- production system
- low level vision
- loopy belief propagation
- textured images
- machine learning
- computer vision
- map estimation
- potential functions
- markov networks
- image analysis
- feature extraction
- image processing
- map inference
- potts model
- conditional random fields
- iterative conditional
- piecewise constant functions
- message passing
- higher order cliques