• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Crop Yield Modelling Applying Leaf Area Index Estimated from Sentinel-2 and Proba-V Data at JECAM site in Poland.

Katarzyna Dabrowska-ZielinskaMaciej BartoldRadoslaw GurdakMartyna GatkowskaWojciech KirylaZbigniew BochenekAlicja Malinska
Published in: IGARSS (2018)
Keyphrases