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Crop Yield Modelling Applying Leaf Area Index Estimated from Sentinel-2 and Proba-V Data at JECAM site in Poland.

Katarzyna Dabrowska-ZielinskaMaciej BartoldRadoslaw GurdakMartyna GatkowskaWojciech KirylaZbigniew BochenekAlicja Malinska
Published in: IGARSS (2018)
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