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A fully automated large-scale addressable test chip design with high reliability.

Bo ZhangWeiwei PanYongjun ZhengZheng ShiXiaolang Yan
Published in: ECCTD (2011)
Keyphrases
  • fully automated
  • high reliability
  • chip design
  • high precision
  • fully automatic
  • low cost
  • semi automated
  • labor intensive
  • real time
  • completely automated
  • control system
  • wireless sensor networks